High Performance Connectors

High Cycle Life Connectors

Almost three decades ago, IDI developed spring probe technology to assist the toughest interconnect customer in the electronics industry… the test engineer. Our test customers have relied on our spring probes to perform up to a million cycles, in demanding, no-clean, contaminated environments. In the semiconductor testing arena, our probes may cycle over 50,000 times within just a couple of days.


In the early 1990’s, IDI probe technology gained wide acceptance by product designers looking for “first stroke, every stroke” reliability over the life span of their products.connectors2.jpg


IDI Multiple Cycle Connectors allow for a higher and more consistent spring force that will remain constant — from the first cycle to the millionth cycle. They are extremely rugged and compact, and are able to deal with wiping interconnect motions as well as harsh environments. Mechanical features are designed into the probes to make PCB mounting simple, whether by wave, hand, or reflow soldering processes.
Some examples of applications using IDI Battery and Connector Contact technology include:
  • A board-to-board interconnect between an electronic device and its programming or docking station.
  • The connection between a mobile radio or cellular phone and its battery.  
  • The interconnect between a camera and a lens.  
  • A switching device between the internal and the external antenna of a mobile radio.
  • The connections from the motherboard to a battery in a notebook computer.
  • A highly reliable battery contact for hand-held emergency radios used in military and police applications.
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R&D Test Lab

Our commitment to “first-cycle, every-cycle" reliability is backed by the extensive product testing and evaluation performed in our Test Lab.

Go to R&D Test Lab


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Info Request

IDI has Sales and Application Engineering Offices around the world to support our global customers.

e-mail IDI
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