Excellent Electrical Properties

High Frequency

It is vital to appreciate the RF electrical performance of a connector is not a singular, simple value, but a function of the entire RF system. Leveraging our experience in the ATE and Semiconductor markets, our proven spring probe technology enables a new ground breaking approach to high frequency interconnects, which deliver significant benefits to the customer while reducing component count and increasing system life.

Our connectors provide a single sided compliant contact that can directly mount to strip line or PCB tracks while enjoying mating cycle lives of over 100,000 and bandwidths greater than 20GHz. Significant gains in circuit density can also be achieved on centers as tight as .010 (0.25mm). 

Low and Consistent Resistance

IDI probes and custom connectors are designed to provide consistent, low resistance, dependably first-cycle, every-cycle.
Low resistance is a major benefit of spring probe technology. In the spring probe, the total contact resistance is determined by two primary factors:

• The bulk resistance of the material
• The internal contact resistance between the plunger and barrel

These sources of resistance can be engineered in the probe design to keep the total contact resistance low and stable, minimizing fatigue both internally and externally, throughout the life of the contact.

Another method used is to insure that current flow is continuously low is a technique called “biasing”. Biasing is the mechanism that forces the plunger against the internal wall of the barrel.

Four different biasing techniques that can be used in spring probe design:

• The first method of biasing is the bias spring. The spring is designed to force the plunger to the barrel. This is the least aggressive method of biasing and is a cost effective and sufficient design for many applications.
• The second method of biasing, a more aggressive approach, is the bias plunger. An angle is cut on the backside of the plunger. The spring bears against this angle, forcing the plunger to the internal wall of the barrel.
• The third method of biasing is the patented eccentric drill design. This biasing technique involves back-drilling a plunger intentionally off-center creating a lateral force for the spring to press the plunger wall to the wall of the barrel. The eccentric drill design allows for a larger spring cavity, which provides greater compliance or travel in a shorter, more compact probe design.
• The fourth and most aggressive biasing technique is the bias ball. The bias ball is similar to the bias plunger but with the added value of a ball bearing between the spring and the plunger. The ball bearing aggressively forces the plunger against the barrel wall providing the lowest and most consistent resistance for the most demanding applications.