High Performance Connectors

High Insertion Life

Almost three decades ago, IDI developed spring probe technology to assist the toughest interconnect customer in the electronics industry… the test engineer. Our test customers have relied on our spring probes to perform up to a million cycles, in demanding, no-clean, contaminated environments.  In the semiconductor testing arena, our probes may cycle over 50,000 times within just a couple of days.

In the early 1990’s, IDI probe technology gained wide acceptance by product designers looking for “first-cycle, every-cycle” reliability over the life span of their products. IDI connectors allow for a connector.jpghigher and more consistent spring force that will remain constant — from the first cycle to the millionth cycle. They are extremely rugged and compact, and are able to deal with wiping interconnect motions as well as harsh environments. Mechanical features are designed into the probes to make PCB mounting simple, whether by wave, hand, or reflow soldering processes.

 

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R&D Test Lab

Our commitment to “first-cycle, every-cycle" reliability is backed by the extensive product testing and evaluation performed in our Test Lab.

Go to R&D Test Lab


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IDI has Sales and Application Engineering Offices around the world to support our global customers.

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