Robust Mechanical Properties
Spring contact probes were originally designed for testing printed circuit boards in the late 1970's. By nature of their design, spring contact probes are extremely robust.
- Cycle life in excess of 500,000
- Contact force remains stable throughout the life of the probe
- Able to withstand nonparallel compressions - side loading or rotation during compression
- Tip configuration is easily designed to provide the best mating surface for each application