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Double Ended Probes and Receptacles
Double Ended Probes and Receptacles are used in a variety of applications including wireless test fixtures for testing loaded boards, board-to-board interconnects and probes used to test semiconductor devices.
Wireless test fixtures for loaded board testing replace the conventional wires with a custom printed circuit board and the single ended receptacle with a double ended receptacle. The probes are identical in both wired and wireless fixtures. The advantages of a wireless fixture include:
  • Faster test speeds
  • Shorter signal paths
  • Eliminates manual wiring errors
  • Eliminates cross talk from moving wires
  • Easy to duplicate for multiple fixtures
  • Excellent repeatability on a single fixture and across multiple fixtures
  • Reduced fixture profile and weight
  • Maximizes the resources of the tester
  • Simplifies debug process
  • Probe pointing accuracy is improved, no wires pulling on receptacle
Wireless fixtures are not generally feasible at lower pin counts (below 2000 test points), unless multiple fixtures are needed or the improved performance justifies the additional cost. Double ended receptacles for wireless test fixtures feature a replaceable probe on the top side and a nonreplaceable probe on the bottom side.
Non-replaceable plunger tips:
  • B – 30° Spear
  • J – Spherical Radius
  • S – 60° Chisel
  • U – 4-Point Crown

    • Spring force on the non-replaceable probe:

  • 2.7 oz. (77gms) at .069 (1,75) travel for R-100 and R-075
  • 3.4 oz. (97gms) at .069 (1,75) travel for R-50C
  • 2.7 oz. (77gms) at .070 (1,77) for the FP-DE probes

    • Replaceable probe:

  • 100 mil – ICT-100 or S-100
  • 75 mil – ICT-075 or S-075 or FP-075
  • 50 mil – ICT-50C or S-50C or FP-050
  • 39 mil – FP-039
    		•
    R-100/SS Double-Ended Receptacle R-SS/SS Double-Ended Receptacle DE-100 & DE-50 Double-Ended Probe
    The R-100/SS features replaceable probes on both ends. The R-100/SS receptacle houses a Size S100 probe and an SS-100 or GSS-100 probe. The extension of the Size S100 probe from the top of the receptacle is .330" (8,38) for headed probes and .315" (8,00) for headless probes. The extension of the SS-100 or GSS-100 will vary based on tip length.

    * For SS-100 or GSS-100 probe with .040" (1,02) tip length.     		The R-SS/SS houses a replaceable SS-100 or a GSS-100 probe on both ends of the receptacle that are replaceable. The extension of the SS-100 or GSS-100 will vary based on tip length.

    * For SS-100 or GSS-100 probe with .040" (1,02) tip length.
    * Headed plunger required on this end.     		The DE-100 and DE-50 are ideal for high performance test applications due to the probe's short signal path. The DE-100 and DE-50 probes are available with a chisel, radius or 4-point crown (50 mil only) on the top-side and a spherical radius on the bottom side of the assembly.
    • Available in .100"(2,54) and .050" (1,27) centers.
    • Maximum travel is .080" (2,03).
    • Minimum compressed height .440" (11,18).
    • Consult factory for alternate tip style options.
    Basic Fixturing | Dual Level Probing | Mixed Center Testing
    Focal Probe Testing
     
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