Battery Contact and Interconnect
Probe Fixturing
Battery Contact and/or Interconnect probes are designed to optimize contact
performance in high reliability, multiple cycle applications. These probes
are very reliable, compact,
durable, and provide an extremely high cycle life, even in the harshest
environments.
Battery Contact and/or Interconnect probes are simply an evolution of
the spring contact probes that have been testing printed circuit boards
for over 30 years. The probe design has been slightly modified, making
this technology suitable for use in consumer and portable electronics.
Examples of applications using Battery Contact and/or Interconnect probes
include:
- Board to board interconnect between an electronic device and
its programming or docking station
- The connection between a mobile radio or cellular phone and
its battery
- Interconnect between a camera body and a zoom lens
- Switching device between the internal and the external antenna
of a mobile radio
Since Battery Contact and/or Interconnect probes are typically components
of systems and are not necessarily used for testing, they are designed
to mount in a columnar format. Most designs integrate a flange on
the barrel of the contact. The flange allows consistent mounting
heights of the probe while orienting it perpendicular to the printed
circuit board or other mounting surface. This flange can vary in
location from the top of the barrel allowing a low profile type mounting
to the bottom allowing the probe to be inserted upwards into a via,
or anywhere in between. Though there are certain instances where
limitations on flange dimensions are required, flanges can be any
shape or size.

Besides flanged battery contact probes, other designs include barrels with
press rings (similar to receptacles), threaded barrels, double-ended battery
contact probes, barrels with posts and back-drilled holes. Some battery
contact probes even have their own receptacles to make removal of the contact
possible. The design possibilities are endless and a battery contact can
almost always be provided for any application.
The majority of Battery Contact and/or Interconnect probes are mounted
vertically in a columnar position either resting on the flange of the barrel
or pushed into a via with the flange providing a stop. The probes can then
be secured in place by a variety of processes. Solder pads, solder lined
vias and solder preforms are typical of the many designs used to secure
the probes in place, usually through a reflow process.
As most probes have a bleed hole in the barrel to
facilitate the plating process, care must be taken to prevent solder
flow into the barrel impairing the operation of the probe. There
are many solutions to the bleed hole issue, including a non-plated
barrel, plated barrels without holes (limited applications), extended
barrels to move the bleed hole away from the solder field, relocation
of bleed holes or a controlled solder application. The solder process
can be removed altogether through mechanical fastening, press fitting,
press rings, or sized to fit a connector, each of which have their
own advantages and disadvantages.
IDI
also has the capability to provide battery contact and/or interconnect
probes in header arrays. Headers, molded or machined out of various
plastics, can be supplied to provide retention of an array of
probes for fast and easy assembly to a printed circuit board
or other product. These headers can be an integral part of the
final assembly or be used just for installation and discarded
after contacts are secured in place.  In addition to headers,
solder preforms may
be added to supply a complete, tidy package for attaching the
probes. Header assemblies can be supplied with mixed technology,
a combination of probes and other types of contacts to satisfy
multiple requirements.
Packaging of battery contacts is usually done in bulk, particularly for
low volume applications. Individual or small quantity packaging along
with special packaging materials can be supplied upon request. Higher
volume applications requiring pick-and-place or tape-and-reel solutions
can be provided by IDI for both probes and header assemblies.

|