-- SELECT ONE -- Series ICT Size 075 Series ICT Size 075 LeadFree Series ICT Size 100 Series ICT Size 100 LeadFree Series ICT Size 50C Series ICT Size 50C LeadFree Series ICT Size 50J Series ICT Size 50J LeadFree Series ICT Size L075 Series ICT Size L100 Series S Size 075 Series S Size 100 Series S Size 50C Series S Size 50J

In-Circuit Test Probes
The industry’s first “centered” probe design for the absolute best pointing accuracy and the lowest, most consistent resistance of any probe series on the market.

-- SELECT ONE -- Series SH Size 100 Series SH Size 3 Series SH Size 4 Series SH Size 5 Series SHE Size 100 Series SHE Size 3 Series SHE Size 4 Series SHE Size 5

High Current Probes
IDI offers two types of designs, a high performance and economy. The SH Series features a bias ball which is one of the most aggressive biasing techniques eliminates “hot spots”. The SHE Series features a bias spring, an effective biasing method for most applications.

-- SELECT ONE -- Series S Size 100 Agilent Interface Probe Series SGR Size 2 Genrad Interface Probe .855 OAL Series SGR Size 2 Genrad Interface Probe .880 OAL

Interface Probes
Interface probe built specifically for GenRad, Teradyne and Agilent test systems.

-- SELECT ONE -- Series S Size 075 Rotator Series S Size 100 Rotator Series S Size 50C Rotator Series S Size 50J Rotator

Rotator Probes
Ideal for no-clean, loaded board testing environments, this aggressive probe rotates up to 90° at the rated travel to virtually drill through contaminants as effectively as ultra-aggressive tips, without requiring a high spring force. A wide variety of steel plungers and high spring force options are available on 50, 75 and 100 mil centers.

-- SELECT ONE -- Series R Size 075 Double Ended Series R Size 100 Double Ended Series R Size 100/SS Receptacle Series R Size 50C Double Ended Series R Size SS/SS Receptacle

-- SELECT ONE -- FP Receptacle Series FP Size 039 Series FP Size 050 Series FP Size 075

Focal Probes (reduced receptacles)
The industry’s new format that allows test engineers to use larger more robust probes on closer centers - on both wired and wireless test fixtures. The plug-able probe design uses an in-line receptacle that allows a 100 mil probe to mount on 75 mil center; a 75 mil probe to mount on 50 mil centers; and a 50 mil probe to mount on 39 mil centers.

-- SELECT ONE -- Series S Size 100 Tri-Needle

Tri Needle
Used to test contaminated targets or pierce conformal coatings on leads and pads. Extremely durable music wire tips resist bending. Available in Size 25 spring contact probe assemblies.

-- SELECT ONE -- Series PI Size 137 Series PI Size 301 Series PI Size 410

Interface Pin
Designed for the electro-mechanical interfaces between the test fixture and the test systems, such as Agilent, GenRad, and Teradyne. They meet or exceed the specifications dictated by the original equipment manufacturer.

-- SELECT ONE -- Series R Size 075 Receptacle Series R Size 100 Receptacle Series R Size 50C Receptacle Series R Size 50J Receptacle

In Circuit Receptacle
Specifically designed to compliment the performance of our in-circuit probes like our ICT Series.

-- SELECT ONE -- Series RH Size 100 Receptacle Series RH Size 3 Receptacle Series RH Size 4 Receptacle Series RH Size 5 Receptacle

High Current Receptacle
Specifically designed to compliment the performance of our high current probes of our SH Series, these receptcles feature a base material change for higher current carrying performance.