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Synergetix

General Purpose Probes

IDI offers the a large selection of probes designed for general-purpose test on bare boards, loaded printed-circuit boards, surface-mount assemblies and as individual components.

 

 
General Purpose Probes
IDI offers a large selection of probes designed for general-purpose test on bare boards, loaded printed-circuit boards, surface-mount assemblies and as individual components.

 

 
Fine Pitch Testing
For applications requiring ultra-close, center-to-center parameters, IDI has pioneered the way toward satisfying those specifications. IDI offers probes for testing on or below .030 (0,76) centers.

 

 
High Current Probes
IDI offers two types of designs, a high performance and economy. The SH Series features a bias ball which is one of the most aggressive biasing techniques eliminates “hot spots”. The SHE Series features a bias spring, an effective biasing method for most applications.

 

 
Bareboard Receptacles
Specifically designed to compliment the performance of our bareboard probes.

 

 
High Current Receptacle
Specifically designed to compliment the performance of our high current probes of our SH Series, these receptcles feature a base material change for higher current carrying performance.