Dual Level Probing
.075" (1.91) and .100" (2.54) Centers
The ICT-L100 and ICT-L075, .400 (10.16)
— long stroke probe works with the S-100, ICT-100, S-075, and ICT-075 in dual-level (functional and in-circuit) test fixtures. The ICT-L100 and standard S-100 or ICT-100 probes are installed in identical (R-100) standard receptacles. The ICT-L075 and standard S-075 or ICT-075 probes are installed in identical (R-075) standard receptacles. As test needs change, probes can be interchanged freely from one receptacle to another.
The figures below show the typical installation for a dual level probing application. The ICT-L100 or ICT-L075 extends .480 (12.19)
above the receptacle and has a maximum stroke of .400 (10,16)
. The S-100, ICT-100, S-075 and ICT-075 probe extends .330 (8.38)
above the receptacle and has a maximum stroke of .250 (6.35)
The first test can be run by compressing the fixture .100 (2.54)
. This results in the ICT-L100 or ICT-L075 probe being deflected .100 (2.54)
and a .050 (1.27)
space between the board and the S-100, ICT-100, S-075 and ICT-075 probe.
The final test can be run by compressing the board an additional .250 (6.35), resulting in a total deflection of .350 (8.89) for the ICT-L100 or ICT-L075 probe, and .150 (3.81) for the S-100, ICT-100, S-075 and ICT-075 probe.