Wireless Receptacle Fixturing

Double Ended Probes and Receptacles are used in a variety of applications including wireless test fixtures for testing loaded boards, board-to-board interconnects and probes used to test semiconductor devices.

Wireless test fixtures for loaded board testing replace the conventional wires with a custom printed circuit board and the single ended receptacle with a double ended receptacle. The probes are identical in both wired and wireless fixtures. The advantages of a wireless fixture include:

• Faster test speeds
• Shorter signal paths
• Eliminates manual wiring errors
• Eliminates cross talk from moving wires
• Easy to duplicate for multiple fixtures
• Excellent repeatability on a single fixture and across multiple fixtures
• Reduced fixture profile and weight
• Maximizes the resources of the tester
• Simplifies debug process
• Probe pointing accuracy is improved, no wires pulling on receptacle

Wireless fixtures are not generally feasible at lower pin counts (below 2000 test points), unless multiple fixtures are needed or the improved performance justifies the additional cost. Double ended receptacles for wireless test fixtures feature a replaceable probe on the top side and a nonreplaceable probe on the bottom side.

	Non-replaceable plunger tips: J – Spherical Radius S – 60° Chisel Spring force on the non-replaceable probe: 2.7 oz. (77gms) at .069 (1.75) travel for R-100 and R-075 3.4 oz. (97gms) at .069 (1.75) travel for R-50C Replaceable probe: 100 mil – ICT-100 or S-100 75 mil – ICT-075 or S-075  50 mil – ICT-50C or S-50C