Plunger Tip Styles and Usages

A Tip- 90° Concave

• Used to test long leads, terminals, and wire wrap posts.

• Contamination and debris can be trapped in the concave area resulting in false failures.

B Tip - 30° Spear (Steel Option)

• Used to test lands, pads, and plated through holes.

• At low spring forces, the spear point is ideal for penetrating thin layers of oxides or contaminates Higher spring forces can be used for thicker layers. 

C Tip - Flat

• Used to test fold edge fingers and gold pads.

• Leaves no witness marks or indentations on UUT.

D Tip - Spherical Radius

• Used to test gold edge fingers or gold pads.

• Leaves no witness marks or indentations on UUT.

E Tip - 90° Convex

• Used to test plated through holes, pads, and lands.

• The smooth cone shaped head allows plated through holes to be tested with minimal witness marks to UUT

F Tip - Flat

• The point of the tip is used to test pads and lands. Used to test gold edge fingers and gold pads.

• Leaves no witness marks or indentations on UUT.

G Tip - Concave

• Used to test long leads, terminals, and wire wrap posts.

• Contamination and debris can be trapped in the concave area resulting in false failures

H Tip - Serrated (Steel Option)

• The serrated tip makes reliable contact with long leads and terminals in the grooved area.

• The 9-point tip provides reliable contact on pads and lands.

• Universal tip style.

HL Tip - 21 Point Serrated

• The oversized serrated head allows reliable contact with mispositioned targets such as leads and connector terminals.

• When used for large pads, the large contact area with multiple current paths provides low resistance.

HSIC - Serrated with Insulating Cap

• The oversized serrated head allows reliable contact with mispositioned targets such as leads and connector terminals.

• When used for large pads, the large contact area with multiple current paths provides low resistance.

HS Tip - Serrated

• Allows testing of small pads and short leads.

• Multiple contact points provide great stability, minimal marking, and low resistance.

JS Tip - Spherical Radius

• Used to test gold edge fingers and gold pads.                            

• Leaves no witness marks or indentations on UUT

J Tip - Spherical Radius

• Used to test gold edge fingers and gold pads.                          

• Leaves no witness marks or indentations on UUT.

K Tip - 45° 4-Sided Chisel

• Used to test plated through holes, pads, and lands.

• The four sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.

• The tip of the chisel contacts the lands and pads.

LM Tip - 90° Star

• Used to test plated through holes, lands, and pads.

• The six sharp edges wipe oxides and contaminants in the plated through holes.

• The tip contacts the lands and pads.

• When used with the ROTATORTM Spring Contact Probe, the head cuts through oxides and contaminants.

M Tip - Headless Blade (Steel Option)

• The sharp headless blade penetrates contaminants, solder masks and conformal coatings on pads, filled and unfilled vias.

• The knife-like edges contact the rim of the unfilled via.

NT - Needle Teeth (Steel Option)

• Used to test pads, and short leads.

• Sharp teeth cut through contaminants.

• Geometry optimized for strength and stability.

R Tip - Headed Blade (Steel Option)

• The sharp headed blade penetrates contaminants, solder masks and conformal coatings on pads, filled and unfilled vias.

• The knife-like edges contact the contaminated rim of the unfilled via.

S Tip - 60° Chisel (Steel Option)

• Used to test plated through holes, pads, and lands.

• The sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.

• The tip of the chisel contacts the lands and pads.

SN Tip - Single Needle (Steel)

• Used to test pads and filled vias.

• Precision ground to extreme sharpness from a special alloy for high resiliency and strength.

• IDI's strongest tip style for piercing contaminants, solder masks, and conformal coatings

SP Tip - Chiseled Spear (Steel)

• The sharp chiseled spear penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.

• The knife-like edges contact contaminated rim of the unfilled via.

SPB Tip - Blunt Chiseled Spear (Steel)

• The blunt chiseled spear penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.

• The blunter tip provides good penetration but does not stick in unfilled vias.

• The knife-like edges contact contaminated rim of the unfilled via.

SW Tip - 4-Sided Arrowhead (Steel)

• The 4-sided arrowhead penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.

• The knife-like edges contact contaminated rim of the unfilled via.

• The wide angle of two of the edges prevent sticking in unfilled vias.

SWS Tip -Sharp Arrowhead (Steel)

• The 4-sided arrowhead penetrates contaminants, solder masks, and conformal coatings on pads, filled vias, and unfilled vias.

• The knife-like edges contact contaminated rim of the unfilled via.

• The wide angle of two of the edges prevent sticking in unfilled vias.

T Tip - 60° Chisel (Steel Option)

• Used to test plated through holes, lands, and pads

• The sharp edges of the chisel cut through the oxides and contaminants in the plated through hole.

• The tip contacts the lands and pads.

• When used with the ROTATORTM Spring Contact Probe, the head cuts through contaminants.

TN Tip - Tri-Needle (Steel)

• Used to test contaminated targets or pierce conformal coatings on leads and pads.

• The three extremely durable music wire tips resist bending.

• Available in Size 25 Spring Contact Probe assemblies.

TX Tip - 3-Point Chiseled Crown

• A very versatile tip that can be used to test plated through holes, lands, pads and vias.
• The head is cut to allow contaminates to easily fall out; self-cleaning tip.
• Penetrates contaminants and coatings on pads, filled vias, and unfilled vias.
• The edges of the gradual taper are used for testing plated through holes.
• The three points contact the pads and lands

U Tip - 4-Point Crown (Steel Option)

• Used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The four points contact the pads or lands

UR Tip - Reduced 4-Point Crown (Steel)

• The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias.

• The tapered tip shape allows the probe to pass close to board components.

UST Tip - 4-Point Tapered Crown (Steel)

• The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias
   
• The tapered tip shape allows the probe to pass close to board components.

UT Tip - 4-Point Tapered Crown

• The reduced 4-point crown diameter allows contact with smaller targets, such as small pads and filled vias.

• The tapered tip shape allows the probe to pass close to board components.

V Tip - 4-Point Crown

• Used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The four points contact the pads or lands.

VLT Tip - 4-Point Crown (Steel)

• Used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The four points contact the pads or lands.

VT Tip - 4-Point Crown (Steel)

• The headed 4-point crown can be used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The four points contact the pads or lands.

V8 Tip - 8-Point Crown

• Appropriate for long leads, connector terminals, and round pads or solder fillets.

• Self-cleaning design allows contaminants to fall clear.

• Large tip radius captures long leads and connector terminals. 

• Available in Size S-075 Spring Contact Probe assemblies.

W Tip - 4-Point Crown (Steel Option)

• Used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The four points contact the pads or lands.

WO Tip - 4-Point Crown (Steel)

• Used to test lands, pads and leads.

• Non-self cleaning design is more stable on misalign leads and connector terminals.

• The four points allow stable, low resistance contact with pads.

X Tip - 4-Point Tapered Crown

• A very versatile tip that can be used to test plated through holes, leads, lands, and pads.
• The head is cut to allow contaminates to easily fall out; self-cleaning tip.
• The edges of the gradual taper are used for testing plated through holes.
• The four points contact the pads and lands.
• The inside edges trap the leads.

Y Tip - Tulip (Steel Option)

• Used to test long leads, terminals, and wire wrap posts.

• The head is cut to allow contaminates to easily fall-out; self-cleaning.

• The inside edges trap the leads.

Z Tip - 3-Point Crown (Steel)

• Used to test lands, pads, and leads.

• The head is cut to allow contaminates to easily fall out; self-cleaning tip.

• The inside edges of the tip trap the leads to make contact.

• The three points contact the pads or lands.