ICT Probe

The ICT design is the first fundamental probe technology that addresses the three primary aspects of performance important for In-Circuit Testing: electrical resistance, pointing accuracy, and durability.

The ICT design features a process that machines the barrel top into four bifurcated beams of precise length and profile. The beams are then coined to perfect center by a special manufacturing process. This provides a compliant pressure fit against the plunger, resulting in a zero working clearance between the plunger and barrel. This seemingly simple innovation, adapted and refined from proven pin and socket connection technology, is exceedingly effective at providing substantial performance gains.

In contrast to the single and highly variable contact point in a bias design, the bifurcated beams provide full radial contact to the plunger. This enlarged contact area never changes as the probe is compressed, always occurring at the point the plunger meets the barrel beams which results in the lowest, most consistent resistance of any probe.