World's Largest  Probe Manufacturer

Search Semiconductor Probes

IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance.  Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads.  IDI also offers our patented Dyno Contact for QFN testing.  The Dyno contact gently wipes the device contact without "board scrubbing".


Global Support

IDI has Sales and Application Engineering Offices around the world to support our global customers.


R&D Test Lab

Our commitment to “first-cycle, every-cycle" reliability is backed by the extensive product testing and evaluation performed in our Test Lab.