Search Semiconductor Probes

IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance.  Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads.  IDI also offers our patented Dyno Contact for QFN testing.  The Dyno contact gently wipes the device contact without "board scrubbing".