World's Largest  Probe Manufacturer

Search Semiconductor Probes

IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance.  Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads.  IDI also offers our patented Dyno Contact for QFN testing.  The Dyno contact gently wipes the device contact without "board scrubbing".

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Global Support

IDI has Sales and Application Engineering Offices around the world to support our global customers.

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R&D Test Lab

Our commitment to “first-cycle, every-cycle" reliability is backed by the extensive product testing and evaluation performed in our Test Lab.


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