Search Semiconductor Probes
IDI's semiconductor probe designs combine conductivity and rigidity to form a reliable electrical path with excellent force distribution and compliance. Our Homogeneous Probe Series features a device contact tip made from a custom developed solid precious metal alloy that withstands extreme cleaning techniques associated with SAC-105 and NiPdAu contact leads. IDI also offers our patented Dyno Contact for QFN testing. The Dyno contact gently wipes the device contact without "board scrubbing".