High Performance Test Sockets

Offset Kelvin Probe

IDI has developed an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that’s flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm. Plus, the Offset Kelvin contact is uniquely suited to a production environment because of its long life, ease of maintenance and tolerance for device misalignment.

Click on the link below to view the Kelvin probe:
101500 Kelvin Probe

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Our commitment to “first-cycle, every-cycle" reliability is backed by the extensive product testing and evaluation performed in our Test Lab.

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